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Total dose radiation induced changes of the floating body effects in the partially depleted SOI NMOS with ultrathin gate oxide.
Zhiyuan Hu
Lihua Dai
Zhengxuan Zhang
Xiaoyun Li
Shichang Zou
Published in:
IEICE Electron. Express (2018)
Keyphrases
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room temperature
leakage current
field effect transistors
electrical properties
small animal
gate dielectrics
x ray
infrared
silicon dioxide
low dose
human body
electron microscopy
radiation dose
mathematical analysis
high density
steady state
si sio