A novel highly reliable and low-power radiation hardened SRAM bit-cell design.
Dianpeng LinYiran XuXiaonian LiuWenyi ZhuLihua DaiMengying ZhangXiaoyun LiXin XieJianwei JiangHuilong ZhuZhengxuan ZhangShichang ZouPublished in: IEICE Electron. Express (2018)
Keyphrases
- low power
- power consumption
- highly reliable
- single chip
- low power consumption
- low cost
- high speed
- vlsi architecture
- cmos technology
- logic circuits
- digital signal processing
- nm technology
- gate array
- power dissipation
- power reduction
- mixed signal
- high power
- vlsi circuits
- analog to digital converter
- ultra low power
- wireless transmission
- image sensor
- infrared