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J. P. Ousten
Publication Activity (10 Years)
Years Active: 2001-2018
Publications (10 Years): 3
Top Topics
Electronic Devices
Key Issues
High Temperature
Structuring Elements
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Publications
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Malika Elharizi
,
Fadi Zaki
,
Ali Ibrahim
,
Zoubir Khatir
,
Jean-Pierre Ousten
/AlGaN/GaN normally-ON devices.
Microelectron. Reliab.
(2018)
Nausicaa Dornic
,
Ali Ibrahim
,
Zoubir Khatir
,
Son-Ha Tran
,
Jean-Pierre Ousten
,
Jeffrey Ewanchuk
,
Stefan Mollov
Analysis of the degradation mechanisms occurring in the topside interconnections of IGBT power devices during power cycling.
Microelectron. Reliab.
(2018)
Ali Ibrahim
,
Jean-Pierre Ousten
,
Richard Lallemand
,
Zoubir Khatir
Power cycling issues and challenges of SiC-MOSFET power modules in high temperature conditions.
Microelectron. Reliab.
58 (2016)
Jean-Pierre Ousten
,
Zoubir Khatir
Investigations of thermal interfaces aging under thermal cycling conditions for power electronics applications.
Microelectron. Reliab.
51 (9-11) (2011)
M. Bouarroudj
,
Zoubir Khatir
,
Jean-Pierre Ousten
,
F. Badel
,
L. Dupont
,
Stéphane Lefebvre
Degradation behavior of 600 V-200 A IGBT modules under power cycling and high temperature environment conditions.
Microelectron. Reliab.
47 (9-11) (2007)
Gerard Coquery
,
S. Carubelli
,
Jean-Pierre Ousten
,
Richard Lallemand
,
Frederic Lecoq
,
Dominique Lhotellier
,
V. de Viry
,
Philippe Dupuy
Power module lifetime estimation from chip temperature direct measurement in an automotive traction inverter.
Microelectron. Reliab.
41 (9-10) (2001)