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Analysis of the degradation mechanisms occurring in the topside interconnections of IGBT power devices during power cycling.

Nausicaa DornicAli IbrahimZoubir KhatirSon-Ha TranJean-Pierre OustenJeffrey EwanchukStefan Mollov
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • power consumption
  • statistical analysis
  • image analysis
  • high density
  • computational power
  • neural network
  • multiscale
  • data structure
  • mobile devices
  • quantitative analysis
  • heterogeneous systems