Ichiro Omura

Publication Activity (10 Years)

Years Active: 2007-2021
Publications (10 Years): 15

Top Topics

Monitoring System

Convertible Bonds

Top Venues

Microelectron. Reliab.

IEEE Trans. Ind. Electron.

Publications

Kazufumi Yuasa, Miki Ueshima, Tadatoshi Babasaki, Ichiro Omura
Multipurpose Strategy for Energy Storage System Based on Capital Asset Pricing Model With Ensemble Approach. IEEE Access 9 (2021)
Toshiro Hiramoto, K. Satoh, Tomoko Matsudai, Wataru Saito, Kuniyuki Kakushima, Takuya Hoshii, K. Furukawa, M. Watanabe, N. Shigyo, Hitoshi Wakabayashi, Kazuo Tsutsui, T. Sarava, Hiroshi Iwai, Atsushi Ogura, Shinichi Nishizawa, Ichiro Omura, H. Ohashi, K. Itou, T. Takakura, M. Fukui, S. Suzuki, Ken Takeuchi, Masanori Tsukuda, Y. Numasawa
Switching of 3300V Scaled IGBT by 5V Gate Drive. ASICON (2019)
Masanori Tsukuda, Seiya Abe, Kazunori Hasegawa, Tamotsu Ninomiya, Ichiro Omura
Bias voltage criteria of gate shielding effect for protecting IGBTs from shoot-through phenomena. Microelectron. Reliab. (2018)
Ravi N. Tripathi, Masanori Tsukuda, Ichiro Omura
A fully digital feedback control of gate driver for current balancing of parallel connected power devices. Microelectron. Reliab. (2018)
Bat-Otgon Bat-Ochir, Battuvshin Bayarkhuu, Kazunori Hasegawa, Masanori Tsukuda, Bayasgalan Dugarjav, Ichiro Omura
Envelop tracking based embedded current measurement for monitoring of IGBT and power converter system. Microelectron. Reliab. (2018)
Kazunori Hasegawa, Shinichi Nishizawa, Ichiro Omura
ESR and capacitance monitoring of a dc-link capacitor used in a three-phase PWM inverter with a front-end diode rectifier. Microelectron. Reliab. (2018)
Akihiko Watanabe, Ichiro Omura
A power cycling degradation inspector of power semiconductor devices. Microelectron. Reliab. (2018)
Masanori Tsukuda, K. Nakashima, S. Tabata, Kazunori Hasegawa, Ichiro Omura
Clamp type built-in current sensor using PCB in high-voltage power modules. Microelectron. Reliab. (2017)
Kazuo Tsutsui, Kuniyuki Kakushima, Takuya Hoshii, A. Nakajima, Shinichi Nishizawa, Hitoshi Wakabayashi, Iriya Muneta, K. Sato, Tomoko Matsudai, Wataru Saito, Takuya Saraya, K. Itou, M. Fukui, S. Suzuki, M. Kobayashi, T. Takakura, Toshiro Hiramoto, Atsushi Ogura, Y. Numasawa, Ichiro Omura, H. Ohashi, Hiroshi Iwai
3D scaling for insulated gate bipolar transistors (IGBTs) with low Vce(sat). ASICON (2017)
Seiya Abe, Kazunori Hasegawa, Masanori Tsukuda, Keiji Wada, Ichiro Omura, Tamotsu Ninomiya
Modelling of the shoot-through phenomenon introduced by the next generation IGBT in inverter applications. Microelectron. Reliab. (2017)
Akihiko Watanabe, R. Nagao, Ichiro Omura
Real-time imaging of temperature distribution inside a power device under a power cycling test. Microelectron. Reliab. (2017)
Masanori Tsukuda, Masahiro Koga, Kenta Nakashima, Ichiro Omura
Micro PCB Rogowski coil for current monitoring and protection of high voltage power modules. Microelectron. Reliab. 64 (2016)
Kazunori Hasegawa, Ichiro Omura, Shinichi Nishizawa
Design and Analysis of a New Evaluation Circuit for Capacitors Used in a High-Power Three-Phase Inverter. IEEE Trans. Ind. Electron. 63 (5) (2016)
Erdenebaatar Dashdondog, Shohei Harada, Yuji Shiba, Ichiro Omura
Failure rate calculation method for high power devices in space applications at low earth orbit. Microelectron. Reliab. 64 (2016)
Kazunori Hasegawa, K. Kozuma, K. Tsuzaki, Ichiro Omura, Shinichi Nishizawa
Temperature rise measurement for power-loss comparison of an aluminum electrolytic capacitor between sinusoidal and square-wave current injections. Microelectron. Reliab. 64 (2016)
H. Tomonaga, Masanori Tsukuda, S. Okoda, R. Noda, K. Tashiro, Ichiro Omura
16-Channel micro magnetic flux sensor array for IGBT current distribution measurement. Microelectron. Reliab. 55 (9-10) (2015)
Masanori Tsukuda, H. Tomonaga, S. Okoda, R. Noda, K. Tashiro, Ichiro Omura
High-throughput and full automatic DBC-module screening tester for high power IGBT. Microelectron. Reliab. 55 (9-10) (2015)
Akihiko Watanabe, Masanori Tsukuda, Ichiro Omura
Failure analysis of power devices based on real-time monitoring. Microelectron. Reliab. 55 (9-10) (2015)
Kazunori Hasegawa, Kenichi Yamamoto, Hidetaro Yoshida, Kota Hamada, Masanori Tsukuda, Ichiro Omura
Short-circuit protection for an IGBT with detecting the gate voltage and gate charge. Microelectron. Reliab. 54 (9-10) (2014)
Junpei Takaishi, Syohei Harada, Masanori Tsukuda, Ichiro Omura
Structure oriented compact model for advanced trench IGBTs without fitting parameters for extreme condition: Part II. Microelectron. Reliab. 54 (9-10) (2014)
Akihiko Watanabe, Masanori Tsukuda, Ichiro Omura
Real time degradation monitoring system for high power IGBT module under power cycling test. Microelectron. Reliab. 53 (9-11) (2013)
Hiroaki Shiratsuchi, Kohei Matsushita, Ichiro Omura
IGBT chip current imaging system by scanning local magnetic field. Microelectron. Reliab. 53 (9-11) (2013)
Akihiko Watanabe, Ichiro Omura
Real-time failure imaging system under power stress for power semiconductors using Scanning Acoustic Tomography (SAT). Microelectron. Reliab. 52 (9-10) (2012)
Yuya Kasho, Hidetoshi Hirai, Masanori Tsukuda, Ichiro Omura
Tiny-scale "stealth" current sensor to probe power semiconductor device failure. Microelectron. Reliab. 51 (9-11) (2011)
Masahiro Tanaka, Ichiro Omura
Structure oriented compact model for advanced trench IGBTs without fitting parameters for extreme condition: Part I. Microelectron. Reliab. 51 (9-11) (2011)
Masanori Tsukuda, Keiichiro Kawakami, Kenichi Takahama, Ichiro Omura
"Design for EMI" approach on power PiN diode reverse recovery. Microelectron. Reliab. 51 (9-11) (2011)
Zheng John Shen, Ichiro Omura
Power Semiconductor Devices for Hybrid, Electric, and Fuel Cell Vehicles. Proc. IEEE 95 (4) (2007)