3D scaling for insulated gate bipolar transistors (IGBTs) with low Vce(sat).
Kazuo TsutsuiKuniyuki KakushimaTakuya HoshiiA. NakajimaShinichi NishizawaHitoshi WakabayashiIriya MunetaK. SatoTomoko MatsudaiWataru SaitoTakuya SarayaK. ItouM. FukuiS. SuzukiM. KobayashiT. TakakuraToshiro HiramotoAtsushi OguraY. NumasawaIchiro OmuraH. OhashiHiroshi IwaiPublished in: ASICON (2017)