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Tiny-scale "stealth" current sensor to probe power semiconductor device failure.

Yuya KashoHidetoshi HiraiMasanori TsukudaIchiro Omura
Published in: Microelectron. Reliab. (2011)
Keyphrases
  • power consumption
  • scale space
  • sensor data
  • data acquisition
  • image processing
  • low cost
  • multi sensor
  • small scale
  • semiconductor devices
  • real time
  • social networks