Henrik Hovsepyan

Publication Activity (10 Years)

Years Active: 2009-2019
Publications (10 Years): 1

Top Topics

Image Representation

Discrete Event Simulation

Reliability Analysis

Top Venues

J. Electron. Test.

Publications

Armen Kteyan, Henrik Hovsepyan, Jun-Ho Choy, Valeriy Sukharev
Assesment of CPI Stress Impact on IC Reliability and Performance in 2.5D/3D Packages. IRPS (2019)
Jun-Ho Choy, Valeriy Sukharev, Armen Kteyan, Henrik Hovsepyan, Ramnath Venkatraman, Ruggero Castagnetti
Post placement leakage reduction with stress-enhanced filler cells. ISLPED (2015)
Valeriy Sukharev, Armen Kteyan, Jun-Ho Choy, Henrik Hovsepyan, Ara Markosian, Ehrenfried Zschech, Rene Huebner
Multi-scale Simulation Methodology for Stress Assessment in 3D IC: Effect of Die Stacking on Device Performance. J. Electron. Test. 28 (1) (2012)
Valeriy Sukharev, Ara Markosian, Armen Kteyan, Levon Manukyan, Nikolay Khachatryan, Jun-Ho Choy, Hasmik Lazaryan, Henrik Hovsepyan, Seiji Onoue, Takuo Kikuchi, Tetsuya Kamigaki
Control of design specific variation in etch-assisted via pattern transfer by means of full-chip simulation. ISQED (2009)