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Assesment of CPI Stress Impact on IC Reliability and Performance in 2.5D/3D Packages.

Armen KteyanHenrik HovsepyanJun-Ho ChoyValeriy Sukharev
Published in: IRPS (2019)
Keyphrases
  • image registration
  • case study
  • integrated circuit
  • reinforcement learning
  • wide range
  • hidden markov models
  • open source
  • power system
  • reliability analysis