Helmut Puchner

Publication Activity (10 Years)

Years Active: 2001-2022
Publications (10 Years): 5

Top Topics

Failure Prediction

Sampling Strategies

Computing Systems

Top Venues

J. Electron. Test.

Publications

Golnaz Korkian, Daniel León, Francisco J. Franco, Juan Carlos Fabero, Manon Letiche, Yolanda Morilla, Pedro Martin-Holgado, Helmut Puchner, Hortensia Mecha, Juan Antonio Clemente
Single Event Upsets Under Proton, Thermal, and Fast Neutron Irradiation in Emerging Nonvolatile Memories. IEEE Access 10 (2022)
Carlos J. Gonzalez, Bruno L. Costa, Diego N. Machado, Rafael Galhardo Vaz, Alexis C. Vilas Bôas, Odair Lelis Gonçalez, Helmut Puchner, Fernanda Lima Kastensmidt, Nilberto H. Medina, Marcilei Aparecida Guazzelli, Tiago Roberto Balen
Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs. J. Electron. Test. 37 (3) (2021)
Mohammadreza Rezaei, Francisco J. Franco, Juan Carlos Fabero, Hortensia Mecha, Helmut Puchner, Juan Antonio Clemente
Impact of DVS on Power Consumption and SEE Sensitivity of COTS Volatile SRAMs. LATS (2021)
Lucas Matana Luza, Daniel Söderström, Helmut Puchner, Rubén García Alía, Manon Letiche, Alberto Bosio, Luigi Dilillo
Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM. DTIS (2020)
Lucas Matana Luza, Daniel Söderström, Georgios Tsiligiannis, Helmut Puchner, Carlo Cazzaniga, Ernesto Sánchez, Alberto Bosio, Luigi Dilillo
Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems. DFT (2020)
Helmut Puchner
NBTI product level reliability for a low-power SRAM technology. Microelectron. Reliab. 47 (6) (2007)
Y. Z. Xu, O. Pohland, C. Cai, Helmut Puchner
Leakage Increase of Narrow and Short BCPMOS. ISQED (2004)
Helmut Puchner, Y.-C. Liu, W. Kong, F. Duan, R. Castagnetti
Substrate Engineering to Improve Soft-Error-Rate Immunity for SRAM Technologies. Microelectron. Reliab. 41 (9-10) (2001)