Single Event Upsets Under Proton, Thermal, and Fast Neutron Irradiation in Emerging Nonvolatile Memories.
Golnaz KorkianDaniel LeónFrancisco J. FrancoJuan Carlos FaberoManon LeticheYolanda MorillaPedro Martin-HolgadoHelmut PuchnerHortensia MechaJuan Antonio ClementePublished in: IEEE Access (2022)