NBTI product level reliability for a low-power SRAM technology.

Published in: Microelectron. Reliab. (2007)

Keyphrases

low power
power consumption
cmos technology
low cost
high speed
wireless transmission
gate array
nm technology
single chip
high power
low power consumption
logic circuits
real time
vlsi architecture
vlsi circuits
mixed signal
power saving
digital signal processing
image sensor
ultra low power