Login / Signup

Substrate Engineering to Improve Soft-Error-Rate Immunity for SRAM Technologies.

Helmut PuchnerY.-C. LiuW. KongF. DuanR. Castagnetti
Published in: Microelectron. Reliab. (2001)
Keyphrases
  • error rate
  • test set
  • lower error rates
  • power consumption
  • rule sets
  • equal error rate
  • machine learning
  • software engineering
  • text entry
  • false discovery rate