H. E. Maes

Publication Activity (10 Years)

Years Active: 2001-2007
Publications (10 Years): 0

Publications

A. Shickova, Ben Kaczer, Anabela Veloso, Marc Aoulaiche, M. Houssa, H. E. Maes, Guido Groeseneken, J. A. Kittl
NBTI reliability of Ni FUSI/HfSiON gates: Effect of silicide phase. Microelectron. Reliab. 47 (4-5) (2007)
Vesselin K. Vassilev, Steven Thijs, P. L. Segura, Piet Wambacq, Paul Leroux, Guido Groeseneken, M. I. Natarajan, H. E. Maes, Michiel Steyaert
ESD-RF co-design methodology for the state of the art RF-CMOS blocks. Microelectron. Reliab. 45 (2) (2005)
Vesselin K. Vassilev, Snezana Jenei, Guido Groeseneken, Rafael Venegas, Steven Thijs, Vincent De Heyn, M. Natarajan Iyer, Michiel Steyaert, H. E. Maes
High frequency characterization and modelling of the parasitic RC performance of two terminal ESD CMOS protection devices. Microelectron. Reliab. 43 (7) (2003)
M. Lorenzini, Luc Haspeslagh, Jan Van Houdt, H. E. Maes
Simulation of 0.35 μm/0.25 μm CMOS Technology Doping Profiles. VLSI Design 2001 (1) (2001)