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High frequency characterization and modelling of the parasitic RC performance of two terminal ESD CMOS protection devices.

Vesselin K. VassilevSnezana JeneiGuido GroesenekenRafael VenegasSteven ThijsVincent De HeynM. Natarajan IyerMichiel SteyaertH. E. Maes
Published in: Microelectron. Reliab. (2003)
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