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NBTI reliability of Ni FUSI/HfSiON gates: Effect of silicide phase.

A. ShickovaBen KaczerAnabela VelosoMarc AoulaicheM. HoussaH. E. MaesGuido GroesenekenJ. A. Kittl
Published in: Microelectron. Reliab. (2007)
Keyphrases
  • highly reliable
  • three dimensional
  • multi agent
  • data sets
  • neural network
  • information retrieval
  • database systems
  • medical images
  • software reliability