Gordon Russell

Publication Activity (10 Years)

Years Active: 2002-2012
Publications (10 Years): 0

Top Topics

Manufacturing Process

Power Dissipation

Measurement Model

Top Venues

Publications

Chenxi Ni, Ziyad Al Tarawneh, Gordon Russell, Alexandre V. Bystrov
Modelling and Analysis of Manufacturing Variability Effects from Process to Architectural Level. PATMOS (2012)
Ahmed Naif M. Alahmadi, Gordon Russell, Alex Yakovlev
Reconfigurable time interval measurement circuit incorporating a programmable gain time difference amplifier. DDECS (2012)
Gordon Russell, Frank P. Burns, Alex Yakovlev
VARMA - VARiability modelling and analysis tool. DDECS (2012)
Chenxi Ni, Gordon Russell, Alex Bystrov
Statistical delay modelling of manufacturing process variations at system level. NEWCAS (2012)
Nor Muzlifah Mahyuddin, Gordon Russell, E. Graeme Chester
Design and analysis of a low-swing driver scheme for long interconnects. Microelectron. J. 42 (9) (2011)
Santosh Shedabale, Gordon Russell, Alexandre Yakovlev
M-PRES: a statistical tool for modelling the impact of manufacturing process variations on circuit-level performance parameters. IET Circuits Devices Syst. 5 (5) (2011)
Jun Zhou, Maryam Ashouei, David Kinniment, Jos Huisken, Gordon Russell, Alexandre Yakovlev
Sub-threshold synchronizer. Microelectron. J. 42 (6) (2011)
Jun Zhou, Maryam Ashouei, David Kinniment, Jos Huisken, Gordon Russell
Extending Synchronization from Super-Threshold to Sub-threshold Region. ASYNC (2010)
Nikolaos Minas, David Kinniment, Gordon Russell, Alex Yakovlev
High resolution flash time-to-digital converter with sub-picosecond measurement capabilities. SoC (2008)
Jun Zhou, David Kinniment, Charles E. Dike, Gordon Russell, Alexandre Yakovlev
On-Chip Measurement of Deep Metastability in Synchronizers. IEEE J. Solid State Circuits 43 (2) (2008)
Santosh Shedabale, Hiran Ramakrishnan, Gordon Russell, Alexandre Yakovlev, Sanatan Chattopadhyay
Statistical modelling of the variation in advanced process technologies using a multi-level partitioned response. IET Circuits Devices Syst. 2 (5) (2008)
Nikolaos Minas, Matthew Marshall, Gordon Russell, Alex Yakovlev
FPGA Implementation of an Asynchronous Processor with Both Online and Offline Testing Capabilities. ASYNC (2008)
Basel Halak, Santosh Shedabale, Hiran Ramakrishnan, Alexandre Yakovlev, Gordon Russell
The impact of variability on the reliability of long on-chip interconnect in the presence of crosstalk. SLIP (2008)
Jun Zhou, David Kinniment, Gordon Russell, Alex Yakovlev
Adapting Synchronizers to the Effects of on Chip Variability. ASYNC (2008)
Matthew Marshall, Gordon Russell
A Low Power Information Redundant Concurrent Error Detecting Asynchronous Processor. DSD (2007)
M. Amir Abas, Gordon Russell, David Kinniment
Embedded high-resolution delay measurement system using time amplification. IET Comput. Digit. Tech. 1 (2) (2007)
Nikolaos Minas, David Kinniment, Keith Heron, Gordon Russell
A High Resolution Flash Time-to-Digital Converter Taking Into Account Process Variability. ASYNC (2007)
David Kinniment, Charles E. Dike, Keith Heron, Gordon Russell, Alexandre Yakovlev
Measuring Deep Metastability and Its Effect on Synchronizer Performance. IEEE Trans. Very Large Scale Integr. Syst. 15 (9) (2007)
M. Amir Abas, Gordon Russell, David Kinniment
Built-in time measurement circuits - a comparative design study. IET Comput. Digit. Tech. 1 (2) (2007)
David Kinniment, Keith Heron, Gordon Russell
Measuring Deep Metastability. ASYNC (2006)
Jun Zhou, David Kinniment, Gordon Russell, Alexandre Yakovlev
A Robust Synchronizer. ISVLSI (2006)
M. Amir Abas, Gordon Russell, D. J. Kinniment
Design of Sub-10-Picoseconds On-Chip Time Measurement Circuit. DATE (2004)
D. J. Kinniment, Oleh V. Maevsky, Alexandre V. Bystrov, Gordon Russell, Alexandre Yakovlev
On-chip structures for timing measurement and test. Microprocess. Microsystems 27 (9) (2003)
D. J. Kinniment, Oleh V. Maevsky, Gordon Russell, Alexandre Yakovlev, Alexandre V. Bystrov
On-Chip Structures for Timing Measurements and Test. ASYNC (2002)