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The impact of variability on the reliability of long on-chip interconnect in the presence of crosstalk.
Basel Halak
Santosh Shedabale
Hiran Ramakrishnan
Alexandre Yakovlev
Gordon Russell
Published in:
SLIP (2008)
Keyphrases
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high speed
low cost
power dissipation
high impact
image processing
database systems
neural network
power consumption
programmable logic
reliability analysis
highly reliable
single chip
circuit design
correlation analysis
high density
low power
input output