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On-Chip Structures for Timing Measurements and Test.
D. J. Kinniment
Oleh V. Maevsky
Gordon Russell
Alexandre Yakovlev
Alexandre V. Bystrov
Published in:
ASYNC (2002)
Keyphrases
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high speed
data sets
databases
neural network
low cost
software development
physical design
database
search engine
test cases
statistical tests
single chip
high bandwidth