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On-Chip Measurement of Deep Metastability in Synchronizers.
Jun Zhou
David Kinniment
Charles E. Dike
Gordon Russell
Alexandre Yakovlev
Published in:
IEEE J. Solid State Circuits (2008)
Keyphrases
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high speed
high density
analog vlsi
low cost
single chip
sigma delta
higher order
signal processing
multistage
data acquisition
physical design
measurement model