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Edward Yi Chang
Publication Activity (10 Years)
Years Active: 2009-2024
Publications (10 Years): 7
Top Topics
Active Power
Thin Film
Power Losses
Positively Correlated
Top Venues
IRPS
DRC
Sensors
ASICON
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Publications
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Shivendra K. Rathaur
,
Abhisek Dixit
,
Edward Yi Chang
Investigation on Positive Bias-Induced Threshold Voltage Instability in GaN-on-Si D-mode Power MIS-HEMTs.
DRC
(2024)
Muhammad Musoddiq Jaafar
,
Mohd Farhanulhakim Mohd Razip Wee
,
Hoang-Tan-Ngoc Nguyen
,
Le Trung Hieu
,
Rahul Rai
,
Ashish Kumar Sahoo
,
Chang Fu Dee
,
Edward Yi Chang
,
Burhanuddin Yeop Majlis
,
Clarence Augustine Th Tee
Surface Acoustic Wave Propagation of GaN/Sapphire Integrated with a Gold Guiding Layer.
Sensors
23 (5) (2023)
Yan-Kui Liang
,
June-Yang Zheng
,
Yu-Lon Lin
,
Wei-Li Li
,
Yu-Cheng Lu
,
Dong-Ru Hsieh
,
Li-Chi Peng
,
Tsung-Te Chou
,
Chi-Chung Kei
,
Chun-Chieh Lu
,
Huai-Ying Huang
,
Yuan-Chieh Tseng
,
Tien-Sheng Chao
,
Edward Yi Chang
,
Chun-Hsiung Lin
Aggressively Scaled Atomic Layer Deposited Amorphous InZnOx Thin Film Transistor Exhibiting Prominent Short Channel Characteristics (SS= 69 mV/dec.; DIBL = 27.8 mV/V) and High Gm(802 μS/μm at VDS = 2V).
VLSI Technology and Circuits
(2023)
Venkatesan Nagarajan
,
Kun-Ming Chen
,
Huan-Chung Wang
,
Sankalp Kumar Singh
,
Deepak Anandan
,
Yueh-Chin Lin
,
Edward Yi Chang
A simple extraction method for parasitic series resistances in GaN HEMTs considering non-quasi-static effects.
Microelectron. J.
87 (2019)
Chih-Yi Yang
,
Tian-Li Wu
,
Tin-En Hsieh
,
Edward Yi Chang
Investigation of degradation phenomena in GaN-on-Si power MIS-HEMTs under source current and drain bias stresses.
IRPS
(2018)
Tien Tung Luong
,
Yen-Teng Ho
,
Yuen Yee Wong
,
Shane Chang
,
Edward Yi Chang
Phase separation-suppressed and strain-modulated improvement of crystalline quality of AlGaN epitaxial layer grown by MOCVD.
Microelectron. Reliab.
83 (2018)
Edward Yi Chang
,
Quang-Ho Luc
,
Huy-Binh Do
,
Yueh-Chin Lin
Performance improvement of InGaAs FinFET using NH3 treatment.
ASICON
(2017)
Kartika Chandra Sahoo
,
Yiming Li
,
Edward Yi Chang
Numerical calculation of the reflectance of sub-wavelength structures on silicon nitride for solar cell application.
Comput. Phys. Commun.
180 (10) (2009)