Kun-Ming Chen

Publication Activity (10 Years)

Years Active: 2005-2023
Publications (10 Years): 4

Top Topics

State Variables

Prediction Model

Electrical Properties

Top Venues

Microelectron. J.

Publications

Shih-Shin Hu, Kean-Thye Bea, Wei-Hsuan Lin, Da Zheng Lin, Xiu-Zhi Chen, Ting-Ru Lin, Hsin-Hui Hu, Yen-Lin Chen, Kun-Ming Chen, Wai Khuen Cheng
The Electrical Properties of a-IGZO TFT Prediction Based on Variational Autoencoder Model. ICCE-Taiwan (2023)
Khean Thye Bea, Shih-Shin Hu, Wei-Hsuan Lin, Da-Zheng Lin, Hsin-Hui Hu, Xiu-Zhi Chen, Ting-Ru Lin, Yen-Lin Chen, Kun-Ming Chen, Wai Khuen Cheng
Prediction of Electrical Characteristics of a-IGZO TFT Based on Transfer Learning-Based Variational Autoencoder. SMC (2023)
Xiu-Zhi Chen, Da Zheng Lin, Shih-Shin Hu, Hsin-Hui Hu, Yen-Lin Chen, Kun-Ming Chen
Machine Learning-Based Approach to Analyze the Effect of Density of States on the Electrical Properties of a-IGZO TFT. ICCE-TW (2022)
Venkatesan Nagarajan, Kun-Ming Chen, Huan-Chung Wang, Sankalp Kumar Singh, Deepak Anandan, Yueh-Chin Lin, Edward Yi Chang
A simple extraction method for parasitic series resistances in GaN HEMTs considering non-quasi-static effects. Microelectron. J. 87 (2019)
Sheng-Yi Huang, Kun-Ming Chen, Guo-Wei Huang, Cheng-Chou Hung, Wen-Shiang Liao, Chun-Yen Chang
Electrical stress effect on RF power characteristics of SiGe hetero-junction bipolar transistors. Microelectron. Reliab. 48 (2) (2008)
Han-Yu Chen, Guo-Wei Huang, Kun-Ming Chen, Chun-Yen Chang
Noise Parameters Computation of Microwave Devices Using Genetic Algorithms. IEICE Trans. Electron. (7) (2005)
Shih-Dao Wu, Guo-Wei Huang, Kun-Ming Chen, Hua-Chou Tseng, Tsun-Lai Hsu, Chun-Yen Chang
RF MOSFET Characterization by Four-Port Measurement. IEICE Trans. Electron. (5) (2005)
Han-Yu Chen, Kun-Ming Chen, Guo-Wei Huang, Chun-Yen Chang
A Novel Approach for Parameter Determination of HBT Small-Signal Equivalent Circuit. IEICE Trans. Electron. (6) (2005)
Ming-Hsiang Cho, Guo-Wei Huang, Chia-Sung Chiu, Kun-Ming Chen, An-Sam Peng, Yu-Min Teng
A Cascade Open-Short-Thru (COST) De-Embedding Method for Microwave On-Wafer Characterization and Automatic Measurement. IEICE Trans. Electron. (5) (2005)