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A Cascade Open-Short-Thru (COST) De-Embedding Method for Microwave On-Wafer Characterization and Automatic Measurement.
Ming-Hsiang Cho
Guo-Wei Huang
Chia-Sung Chiu
Kun-Ming Chen
An-Sam Peng
Yu-Min Teng
Published in:
IEICE Trans. Electron. (2005)
Keyphrases
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detection method
clustering method
prior knowledge
cost function
computational cost
high accuracy
fully automatic
neural network
high precision
classification method
detection algorithm
pairwise
high dimensional
segmentation method
preprocessing
similarity measure
image sequences