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Investigation of degradation phenomena in GaN-on-Si power MIS-HEMTs under source current and drain bias stresses.

Chih-Yi YangTian-Li WuTin-En HsiehEdward Yi Chang
Published in: IRPS (2018)
Keyphrases
  • power consumption
  • machine learning
  • reactive power compensation
  • data sets
  • databases
  • genetic algorithm
  • information systems
  • website
  • multiscale
  • decision support system
  • metal oxide