Investigation on Positive Bias-Induced Threshold Voltage Instability in GaN-on-Si D-mode Power MIS-HEMTs.
Shivendra K. RathaurAbhisek DixitEdward Yi ChangPublished in: DRC (2024)
Keyphrases
- power losses
- metal oxide
- positive and negative
- electrical power
- power system
- duty cycle
- single phase
- information systems
- reactive power
- power consumption
- transmission line
- power supply
- low voltage
- power quality
- high voltage
- energy dissipation
- active power
- positively correlated
- power transmission
- power management
- variance reduction
- medical images