Ching-Nen Peng

Publication Activity (10 Years)

Years Active: 2012-2017
Publications (10 Years): 5

Top Topics

Subband Decomposition

Automatic Diagnosis

Close Proximity

Top Venues

IEEE Trans. Computers

Publications

Kai-Li Wang, Bing-Yang Lin, Cheng-Wen Wu, Mincent Lee, Hao Chen, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang
Test Cost Reduction Methodology for InFO Wafer-Level Chip-Scale Package. IEEE Des. Test 34 (3) (2017)
Hsuan-Hung Liu, Bing-Yang Lin, Cheng-Wen Wu, Wan-Ting Chiang, Mincent Lee, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang
A Built-Off Self-Repair Scheme for Channel-Based 3D Memories. IEEE Trans. Computers 66 (8) (2017)
Yu-Chieh Huang, Bing-Yang Lin, Cheng-Wen Wu, Mincent Lee, Hao Chen, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang
Efficient probing schemes for fine-pitch pads of InFO wafer-level chip-scale package. DAC (2016)
Bing-Yang Lin, Wan-Ting Chiang, Cheng-Wen Wu, Mincent Lee, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang
Configurable Cubical Redundancy Schemes for Channel-Based 3-D DRAM Yield Improvement. IEEE Des. Test 33 (2) (2016)
Bing-Yang Lin, Cheng-Wen Wu, Mincent Lee, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang
A Local Parallel Search Approach for Memory Failure Pattern Identification. IEEE Trans. Computers 65 (3) (2016)
Hao Chen, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang
Wafer Level Chip Scale Package copper pillar probing. ITC (2014)
Chun-Chuan Chi, Bing-Yang Lin, Cheng-Wen Wu, Min-Jer Wang, Hung-Chih Lin, Ching-Nen Peng
On Improving Interconnect Defect Diagnosis Resolution and Yield for Interposer-Based 3-D ICs. IEEE Des. Test 31 (4) (2014)
Bing-Yang Lin, Wan-Ting Chiang, Cheng-Wen Wu, Mincent Lee, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang
Redundancy architectures for channel-based 3D DRAM yield improvement. ITC (2014)
Mincent Lee, Saman Adham, Min-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Sen-Kuei Hsu, Hao Chen
A novel DFT architecture for 3DIC test, diagnosis and repair. VLSI-DAT (2014)
Ping-Lin Yang, Cheng-Chung Lin, Ming-Zhang Kuo, Sang-Hoo Dhong, Chien-Min Lin, Kevin Huang, Ching-Nen Peng, Min-Jer Wang
A 4-GHz universal high-frequency on-chip testing platform for IP validation. VTS (2014)
Sen-Kuei Hsu, Hao Chen, Chung-Han Huang, Der-Jiann Liu, Wei-Hsun Lin, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang
Test-yield improvement of high-density probing technology using optimized metal backer with plastic patch. ITC (2013)
Tze-Hsin Wu, Po-Yuan Chen, Mincent Lee, Bin-Yen Lin, Cheng-Wen Wu, Chen-Hung Tien, Hung-Chih Lin, Hao Chen, Ching-Nen Peng, Min-Jer Wang
A memory yield improvement scheme combining built-in self-repair and error correction codes. ITC (2012)