Hao Chen

Publication Activity (10 Years)

Years Active: 2012-2020
Publications (10 Years): 8

Top Topics

Top Venues

Publications

Chien-Hui Chuang, Kuan-Wei Hou, Cheng-Wen Wu, Mincent Lee, Chia-Heng Tsai, Hao Chen, Min-Jer Wang
A Deep Learning-Based Screening Method for Improving the Quality and Reliability of Integrated Passive Devices. ITC-Asia (2020)
Mincent Lee, Cheng-Tse Lu, Chia-Heng Tsai, Hao Chen, Min-Jer Wang
Site-aware Anomaly Detection with Machine Learning for Circuit Probing to Prevent Overkill. ITC-Asia (2020)
Chia-Heng Tsai, Chi-Chang Lai, Hao Chen, Min-Jer Wang
Novel Circuit Probing for Tiny Inductor. ITC-Asia (2020)
Chien-Hui Chuang, Kuan-Wei Hou, Cheng-Wen Wu, Mincent Lee, Chia-Heng Tsai, Hao Chen, Min-Jer Wang
A Deep Learning-Based Screening Method for Improving the Quality and Reliability of Integrated Passive Devices. ITC (2020)
Hao Chen, Mincent Lee, Liang-Yen Chen, Min-Jer Wang
High Quality Test Methodology for Highly Reliable Devices. ITC (2019)
Kai-Li Wang, Bing-Yang Lin, Cheng-Wen Wu, Mincent Lee, Hao Chen, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang
Test Cost Reduction Methodology for InFO Wafer-Level Chip-Scale Package. IEEE Des. Test 34 (3) (2017)
Hao Chen, Hung-Chih Lin, Min-Jer Wang
Fan-out wafer level chip scale package testing. ITC-Asia (2017)
Yu-Chieh Huang, Bing-Yang Lin, Cheng-Wen Wu, Mincent Lee, Hao Chen, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang
Efficient probing schemes for fine-pitch pads of InFO wafer-level chip-scale package. DAC (2016)
Hao Chen, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang
Wafer Level Chip Scale Package copper pillar probing. ITC (2014)
Mincent Lee, Saman Adham, Min-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Sen-Kuei Hsu, Hao Chen
A novel DFT architecture for 3DIC test, diagnosis and repair. VLSI-DAT (2014)
Sen-Kuei Hsu, Hao Chen, Chung-Han Huang, Der-Jiann Liu, Wei-Hsun Lin, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang
Test-yield improvement of high-density probing technology using optimized metal backer with plastic patch. ITC (2013)
Tze-Hsin Wu, Po-Yuan Chen, Mincent Lee, Bin-Yen Lin, Cheng-Wen Wu, Chen-Hung Tien, Hung-Chih Lin, Hao Chen, Ching-Nen Peng, Min-Jer Wang
A memory yield improvement scheme combining built-in self-repair and error correction codes. ITC (2012)