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Test Cost Reduction Methodology for InFO Wafer-Level Chip-Scale Package.

Kai-Li WangBing-Yang LinCheng-Wen WuMincent LeeHao ChenHung-Chih LinChing-Nen PengMin-Jer Wang
Published in: IEEE Des. Test (2017)
Keyphrases
  • cost reduction
  • cost savings
  • high speed
  • test cases
  • reinforcement learning
  • semiconductor manufacturing