Carsten Wegener

Publication Activity (10 Years)

Years Active: 2000-2016
Publications (10 Years): 1

Top Topics

Analog Circuits

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Top Venues

J. Electron. Test.

Publications

Gildas Léger, Carsten Wegener
Guest Editorial: Analog, Mixed-Signal and RF Testing. J. Electron. Test. 32 (4) (2016)
Carsten Wegener
Method of modeling analog circuits in verilog for mixed-signal design simulations. ECCTD (2013)
Esa Korhonen, Carsten Wegener, Juha Kostamovaara
Combining the Standard Histogram Method and a Stimulus Identification Algorithm for A/D Converter INL Testing With a Low-Quality Sine Wave Stimulus. IEEE Trans. Circuits Syst. I Regul. Pap. (6) (2010)
Carsten Wegener, Heinz Mattes, Stéphane Kirmser, Frank Demmerle, Sebastian Sattler
Utilizing On-chip Resources for Testing Embedded Mixed-signal Cores. J. Electron. Test. 25 (6) (2009)
Reik Müller, Carsten Wegener, Hans-Joachim Jentschel, Sebastian Sattler, Heinz Mattes
An approach to linear model-based testing for nonlinear cascaded mixed-signal systems. DATE (2009)
Carsten Wegener, Michael Peter Kennedy
Hard-Fault Detection and Diagnosis During the Application of Model-Based Data Converter Testing. J. Electron. Test. 23 (6) (2007)
Carsten Wegener, Michael Peter Kennedy
Test Development Through Defect and Test Escape Level Estimation for Data Converters. J. Electron. Test. 22 (4-6) (2006)
Carsten Wegener, Michael Peter Kennedy
Innovation to overcome limitations of test equipment. ECCTD (2005)
Carsten Wegener, Michael Peter Kennedy
Overcoming Test Setup Limitations by Applying Model-Based Testing to High-Precision ADCs. J. Electron. Test. 21 (3) (2005)
Carsten Wegener, Michael Peter Kennedy
Linear model-based testing of ADC nonlinearities. IEEE Trans. Circuits Syst. I Regul. Pap. (1) (2004)
Carsten Wegener, Michael Peter Kennedy
Testing ADCs for static and dynamic INL - killing two birds with one stone. Comput. Stand. Interfaces 26 (1) (2004)
Gwenolé Maugard, Carsten Wegener, Tom O'Dwyer, Michael Peter Kennedy
Method of reducing contactor effect when testing high-precision ADCs. ITC (2003)
Carsten Wegener, Michael Peter Kennedy
Linear Model-Based Error Identification and Calibration for Data Converters. DATE (2003)
Carsten Wegener, Michael Peter Kennedy
Implementation of Model-Based Testing for Medium to High-Resolution Nyquist-Rate ADCs. ITC (2002)
Carsten Wegener, Michael Peter Kennedy, Bernd Straube
Process Deviations and Spot Defects: Two Aspects of Test and Test Development for Mixed-Signal Circuits. J. Electron. Test. 17 (5) (2001)
Carsten Wegener, Michael Peter Kennedy
Incorporation of Hard-Fault-Coverage in Model-Based Testing of Mixed-Signal ICs. DATE (2000)
Carsten Wegener, Michael Peter Kennedy
Model-based testing of high-resolution ADCs. ISCAS (2000)