Combining the Standard Histogram Method and a Stimulus Identification Algorithm for A/D Converter INL Testing With a Low-Quality Sine Wave Stimulus.
Esa KorhonenCarsten WegenerJuha KostamovaaraPublished in: IEEE Trans. Circuits Syst. I Regul. Pap. (2010)
Keyphrases
- high accuracy
- dynamic programming
- detection method
- preprocessing
- optimization algorithm
- objective function
- low quality
- detection algorithm
- cost function
- recognition algorithm
- identification rate
- segmentation algorithm
- clustering method
- computational cost
- k means
- computational complexity
- similarity measure
- segmentation method
- histogram analysis
- nearest neighborhood
- mathematical model
- matching algorithm
- convergence rate
- histogram equalization
- face detection
- region of interest
- discrete fourier transform
- mean shift
- feature set
- classification accuracy
- transfer function
- binary patterns
- learning algorithm