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Utilizing On-chip Resources for Testing Embedded Mixed-signal Cores.
Carsten Wegener
Heinz Mattes
Stéphane Kirmser
Frank Demmerle
Sebastian Sattler
Published in:
J. Electron. Test. (2009)
Keyphrases
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mixed signal
low power
multi channel
vlsi circuits
digital circuits
dynamic random access memory
cmos technology
power consumption
high speed
low cost
low voltage
single chip
embedded systems
circuit design
level parallelism
processor core