Method of reducing contactor effect when testing high-precision ADCs.

Gwenolé Maugard Carsten Wegener Tom O'Dwyer Michael Peter Kennedy

Published in: ITC (2003)

Keyphrases

high precision
high recall
high accuracy
evaluation method
similarity measure
segmentation method
experimental study
synthetic data
em algorithm
computational cost
main contribution
clustering method
color images
preprocessing
classification method
test data
multiscale
training data
high reliability
feature selection