Incorporation of Hard-Fault-Coverage in Model-Based Testing of Mixed-Signal ICs.

Carsten Wegener Michael Peter Kennedy

Published in: DATE (2000)

Keyphrases

model based testing
mixed signal
test cases
vlsi circuits
low power
multi channel
software development
low cost
software design
testing process
high speed
cmos technology
security policies
sequence diagrams
access control
real time
semi supervised
image processing
artificial intelligence