Overcoming Test Setup Limitations by Applying Model-Based Testing to High-Precision ADCs.
Carsten WegenerMichael Peter KennedyPublished in: J. Electron. Test. (2005)
Keyphrases
- high precision
- model based testing
- test cases
- high recall
- software testing
- software development
- high reliability
- testing process
- sequence diagrams
- achieve high precision
- software design
- test sequences
- test set
- high accuracy
- object oriented
- case study
- regression testing
- security policies
- test suite
- neural network
- intrusion detection
- information technology
- data structure
- learning algorithm