Guest Editorial: Analog, Mixed-Signal and RF Testing.

Gildas Léger Carsten Wegener

Published in: J. Electron. Test. (2016)

Keyphrases

mixed signal
low power
multi channel
vlsi circuits
digital circuits
special issue
cmos technology
low cost
high speed
power consumption
low voltage
radio frequency
relevance feedback
digital signal processing
single chip
dynamic systems
test cases
analog to digital converter