Test Development Through Defect and Test Escape Level Estimation for Data Converters.
Carsten WegenerMichael Peter KennedyPublished in: J. Electron. Test. (2006)
Keyphrases
- data sources
- data sets
- test data
- data collection
- data analysis
- data processing
- complex data
- data quality
- image data
- experimental data
- database
- computer systems
- high quality
- original data
- data mining
- synthetic data
- training data
- input data
- small number
- knowledge discovery
- parameter estimation
- high dimensional data
- data acquisition
- raw data
- data objects
- data points
- mobile devices