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Aizat Abas
ORCID
Publication Activity (10 Years)
Years Active: 2016-2021
Publications (10 Years): 8
Top Topics
Correct Classification
High Temperature
Particle Image Velocimetry
Lattice Boltzmann
Top Venues
Microelectron. Reliab.
Microelectron. J.
Comput. Math. Methods Medicine
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Publications
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Muhammad Naqib Nashrudin
,
Aizat Abas
,
M. Z. Abdullah
,
M. Yusuf Tura Ali
,
Z. Samsudin
,
Idris Mansor
No-flow underfill: Effect of chip placement speed on the void formation using numerical method.
Microelectron. J.
114 (2021)
Fei Chong Ng
,
Aizat Abas
,
Mohd Zulkifly Abdullah
Effect of solder bump shapes on underfill flow in flip-chip encapsulation using analytical, numerical and PIV experimental approaches.
Microelectron. Reliab.
81 (2018)
M. S. Haslinda
,
Aizat Abas
,
F. Che Ani
,
A. Jalar
,
A. A. Saad
,
Mohd Zulkifly Abdullah
nano-reinforced lead free solder at different weighted percentages.
Microelectron. Reliab.
79 (2017)
Fei Chong Ng
,
Aizat Abas
,
Z. L. Gan
,
Mohd Zulkifly Abdullah
,
F. Che Ani
,
M. Yusuf Tura Ali
Discrete phase method study of ball grid array underfill process using nano-silica filler-reinforced composite-encapsulant with varying filler loadings.
Microelectron. Reliab.
72 (2017)
Aizat Abas
,
Muhammad Hafifi Hafiz Ishak
,
Mohd Zulkifly Abdullah
,
F. Che Ani
,
Soon Fuat Khor
Lattice Boltzmann method study of bga bump arrangements on void formation.
Microelectron. Reliab.
56 (2016)
Fei Chong Ng
,
Aizat Abas
,
Muhammad Hafifi Hafiz Ishak
,
Mohd Zulkifly Abdullah
,
M. S. Abdul Aziz
Effect of thermocapillary action in the underfill encapsulation of multi-stack ball grid array.
Microelectron. Reliab.
66 (2016)
Aizat Abas
,
Noorhafizah Hafizah Mokhtar
,
Muhammad Hafifi Hafiz Ishak
,
Mohd Zulkifly Abdullah
,
Ang H. O. Tian
Lattice Boltzmann Model of 3D Multiphase Flow in Artery Bifurcation Aneurysm Problem.
Comput. Math. Methods Medicine
2016 (2016)
Muhammad Hafifi Hafiz Ishak
,
Mohd Zulkifly Abdullah
,
Aizat Abas
Lattice Boltzmann method study of effect three dimensional stacking-chip package layout on micro-void formation during encapsulation process.
Microelectron. Reliab.
65 (2016)