PINHOLE CAMERA
Experts
- Xianghua Ying
- Zhanyi Hu
- Guoyu Lu
- Peter F. Sturm
- Hongbin Zha
- Chandra Kambhamettu
- Khalid Satori
- Satoshi Sato
- Jan-Michael Frahm
- Adrien Bartoli
- Stergios I. Roumeliotis
- Yasunori Ishii
- Javier Civera
- Jen-Hui Chuang
- San Jiang
- Wanshou Jiang
- Takayoshi Yamashita
- Hung-Tat Tsui
- Karla Stépánová
- Xiao Liu
- Su Wang
- Jose Franco
- Abderrahim Saaidi
- John Iacono
- Liang Li
- Jae-Hean Kim
- Kyung Ho Jang
- Rudi Penne
- Vida Dujmovic
- Xuchong Qiu
- Rashmi Sundareswara
- Joel A. Hesch
- Paul R. Schrater
- Sébastien Collette
- Eduardo M. Nebot
- Alexander Wendel
- Yawen Lu
- Jean-Yves Guillemaut
- Soon-Yong Park
Venues
- CoRR
- CVPR
- ICRA
- IEEE Trans. Instrum. Meas.
- ICCV
- IROS
- IEEE Access
- IEEE Trans. Pattern Anal. Mach. Intell.
- Sensors
- ICPR (1)
- ICIP
- ICPR
- CVPR Workshops
- Remote. Sens.
- BMVC
- IEEE Geosci. Remote. Sens. Lett.
- Int. J. Comput. Vis.
- Pattern Recognit.
- IEEE Trans. Circuits Syst. Video Technol.
- VISAPP (1)
- EUSIPCO
- Comput. Vis. Image Underst.
- ITSC
- ROBIO
- CRV
- SII
- ICASSP
- Robotics Comput. Integr. Manuf.
- 3DIM
- RCAR
- VMV
- ECCV (2)
- Image Vis. Comput.
- CDC
- IET Image Process.
- Pattern Recognit. Lett.
- IEEE Robotics Autom. Lett.
- ICCV Workshops
- ECCV (3)
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