OPTICAL CENTER
Experts
- Peter F. Sturm
- Martin Klemm
- Harald Hoppe
- Subodh Mishra
- Yuanxin Wu
- Carlos Sagüés
- Gonzalo López-Nicolás
- Fabian Seebacher
- Srikanth Saripalli
- Tomás Pajdla
- Ole Jakob Elle
- Zhitian Wu
- Tat-Jun Chin
- Joaquín Salas
- Saikat Chatterjee
- Peter M. Roth
- Michael J. Black
- Joachim Tesch
- Yihang Luo
- Frédéric Bernardin
- Ian D. Reid
- Sandipan Das
- Emmett Wise
- Kyrre Glette
- Otmar Hilliges
- José Jesús Guerrero
- Yuekun Dai
- Camillo J. Taylor
- Addi Djikic
- Emre Aksu
- João Pedro Barreto
- Zhongwei Tang
- Shuo Wang
- Seth Hutchinson
- Cristina Turrini
- Alberto Alzati
- Gerd Bruder
- Navid Mahabadi
- Zvi S. Roth
Venues
- CoRR
- ICRA
- Sensors
- IROS
- IEEE Trans. Instrum. Meas.
- Remote. Sens.
- CVPR
- ICIP
- ICCV
- IEEE Access
- IEEE Trans. Pattern Anal. Mach. Intell.
- IGARSS
- IEEE Robotics Autom. Lett.
- Pattern Recognit. Lett.
- ITSC
- ACCV (1)
- CVPR Workshops
- J. Electronic Imaging
- ACCV (2)
- SIGGRAPH Posters
- ICDIP
- ICDSC
- Int. J. Robotics Autom.
- J. Sensors
- FUSION
- ICIP (2)
- Int. J. Comput. Vis.
- ROBIO
- NEWCAS
- IEEE Trans. Consumer Electron.
- SII
- IEEE Trans. Robotics
- SIGGRAPH Asia Posters
- ICASSP
- IQSP
- CAIP
- ICCE
- Mach. Vis. Appl.
- VSIP
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