OBSERVATION MODEL
Experts
- Petar M. Djuric
- Prashant G. Mehta
- Mónica F. Bugallo
- Fredrik Gustafsson
- Amirhossein Taghvaei
- Huchuan Lu
- Lyudmila Mihaylova
- Norikazu Ikoma
- Sean P. Meyn
- Branko Ristic
- Takeshi Ikenaga
- Thomas B. Schön
- Yunpeng Li
- Amir Asif
- Karl Berntorp
- Juan José Pantrigo
- Namrata Vaswani
- Xina Cheng
- Simon J. Godsill
- Marcelo G. S. Bruno
- Arash Mohammadi
- Kyoung Mu Lee
- Mark R. Morelande
- Arnaud Doucet
- Ajay Jasra
- Antonio S. Montemayor
- Mark Coates
- Joaquín Míguez
- Simon Maskell
- Ming-Hsuan Yang
- Lingjiang Kong
- Wee Sun Lee
- Tao Yang
- Bogdan Kwolek
- Fasheng Wang
- Haibin Ling
- Rickard Karlsson
- Wei Yi
- James J. Little
Venues
- CoRR
- FUSION
- IEEE Access
- ICASSP
- Sensors
- ICRA
- IROS
- ICIP
- ACC
- EUSIPCO
- IEEE Trans. Signal Process.
- CVPR
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Image Process.
- CDC
- ICPR
- Multim. Tools Appl.
- IEEE Trans. Circuits Syst. Video Technol.
- Neurocomputing
- IEEE Trans. Aerosp. Electron. Syst.
- IEEE Signal Process. Lett.
- Signal Process.
- ICCV
- Pattern Recognit.
- ROBIO
- IEEE Trans. Pattern Anal. Mach. Intell.
- ITSC
- EURASIP J. Adv. Signal Process.
- Image Vis. Comput.
- SMC
- ICME
- IECON
- Mach. Vis. Appl.
- IPIN
- ICASSP (4)
- Comput. Vis. Image Underst.
- ICASSP (3)
- Digit. Signal Process.
- J. Vis. Commun. Image Represent.
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