DETECTING AND TRACKING MULTIPLE
Experts
- Nassir Navab
- Gerhard Widmer
- Nasser Kehtarnavaz
- Dawei Du
- Bernt Schiele
- Peter H. N. de With
- Pengfei Zhu
- Mykhaylo Andriluka
- Radu Timofte
- Qinghua Hu
- Junzhou Zhao
- Dong Wang
- Iljoo Baek
- Andrey Ignatov
- Pinghui Wang
- Xiaohong Guan
- Don Towsley
- Longyin Wen
- Charles Brazier
- John C. S. Lui
- Cristofer Englund
- Gregory D. Hager
- Rita Cucchiara
- Nikolaos Evangeliou
- Daitao Xing
- Gérard G. Medioni
- Richard Bowden
- Anthony Tzes
- Yimin Zhang
- Vincent Lepetit
- Dan Zeng
- Jason A. Tran
- Stefan Roth
- Filip Sroubek
- Fredrik Svanström
- Senem Velipasalar
- Pradipta Ghosh
- Jumpei Shimamura
- Slobodan Ilic
Venues
- CoRR
- Sensors
- IEEE Access
- AVSS
- ICASSP
- ICRA
- IROS
- Remote. Sens.
- CVPR
- J. Real Time Image Process.
- Multim. Tools Appl.
- ICIP
- ITSC
- IEEE Trans. Geosci. Remote. Sens.
- EMBC
- Comput. Electron. Agric.
- ICPR
- IEEE Trans. Instrum. Meas.
- CVPR Workshops
- Mach. Vis. Appl.
- IEEE Trans. Intell. Transp. Syst.
- Intelligent Vehicles Symposium
- FUSION
- BMVC
- ISCAS
- IGARSS
- ICCV
- IEEE Robotics Autom. Lett.
- SMC
- Image Vis. Comput.
- ACC
- EUSIPCO
- Expert Syst. Appl.
- Digit. Signal Process.
- IEEE Trans. Aerosp. Electron. Syst.
- CIARP
- SenSys
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICCV Workshops
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