CONTROL PROGRAM
Experts
- Mehdi Dastani
- George Saon
- John-Jules Ch. Meyer
- Koen V. Hindriks
- Ahmed El Hajjaji
- Luigi del Re
- Jürgen Teich
- Janusz Borkowski
- Junmin Wang
- Lidia Mangu
- Shaoying Liu
- Rafael H. Bordini
- Marek Tudruj
- Martin Monperrus
- Abdel Aitouche
- Jérôme Bosche
- Jonathan Chauvin
- Yue-Yun Wang
- Nicolas Petit
- Frank Willems
- Hong-Kwang Jeff Kuo
- Abhik Roychoudhury
- Brian Logan
- Martin C. Rinard
- Egon Börger
- Wlodzimierz Drabent
- Hagen Soltau
- Robert Glück
- Cornelis A. Middelburg
- Bram de Jager
- M. Birna van Riemsdijk
- Alessandro Ricci
- Zohar Manna
- Magnus Egerstedt
- Louise A. Dennis
- Keiichiro Yoshida
- H. Harry Asada
- Michael Carbin
- Bertrand Meyer
Venues
- CoRR
- ACC
- CDC
- IEEE Access
- IEEE Trans. Control. Syst. Technol.
- ECC
- ICRA
- Autom.
- Commun. ACM
- IEEE Trans. Ind. Electron.
- IROS
- IECON
- IEEE Trans. Software Eng.
- ACM SIGPLAN Notices
- Sci. Comput. Program.
- ICSE
- Sensors
- IAS
- IACR Cryptol. ePrint Arch.
- Comput. Phys. Commun.
- DAC
- Comput. Chem. Eng.
- MED
- SIGCSE
- IBM Syst. J.
- CCA
- IJCAI
- IEEE Trans. Computers
- Softw. Pract. Exp.
- IEEE Trans. Autom. Control.
- Proc. ACM Program. Lang.
- ISCAS
- ASE
- Computer
- CDC/ECC
- Microprocess. Microsystems
- Comput. J.
- POPL
- ACM Trans. Program. Lang. Syst.
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