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A New Method for Low-Capture-Power Test Generation for Scan Testing.

Xiaoqing WenYoshiyuki YamashitaSeiji KajiharaLaung-Terng WangKewal K. SalujaKozo Kinoshita
Published in: IEICE Trans. Inf. Syst. (2006)
Keyphrases
  • test generation
  • objective function
  • significant improvement
  • matching algorithm
  • test data
  • database
  • detection method
  • error rate
  • test cases
  • test sequences