A Unified Approach for a Time-Domain Built-In Self-Test Technique and Fault Detection.
Benoit ProvostEdgar Sánchez-SinencioAnna Maria BrosaPublished in: Great Lakes Symposium on VLSI (1998)
Keyphrases
- fault detection
- built in self test
- fault diagnosis
- frequency domain
- integrated circuit
- industrial processes
- fault identification
- vibration signal
- condition monitoring
- tennessee eastman
- fault detection and diagnosis
- rotating machinery
- failure detection
- robust fault detection
- fault localization
- fault isolation
- neural network
- fault detection and isolation
- case based reasoning
- decision making
- heuristic search
- fuel cell
- np hard
- feature extraction