Macro Testing: Unifying IC and Board Test.
Frans P. M. BeenkerKarel J. E. van EerdewijkRobert B. W. GerritsenFrank N. PeacockMax van der StarPublished in: IEEE Des. Test (1986)
Keyphrases
- test cases
- software testing
- test data
- regression testing
- statistical tests
- test suite
- test case generation
- test data generation
- test sequences
- statistical significance
- number of test cases
- test generation
- real time
- usability testing
- metadata
- integration testing
- database
- integrated circuit
- software engineering
- mobile robot
- relational databases
- expert systems
- model based testing