Frans P. M. Beenker

Publication Activity (10 Years)

Years Active: 1985-1993
Publications (10 Years): 0

Publications

Hans Bouwmeester, Steven Oostdijk, Frank Bouwman, Rudi Stans, Loek Thijssen, Frans P. M. Beenker
Minimizing Test Time by Exploiting Parallelism in Macro Test. ITC (1993)
Frank Bouwman, Steven Oostdijk, Rudi Stans, Ben Bennetts, Frans P. M. Beenker
Macro Testability: The Results of Production Device Applications. ITC (1992)
Rob Dekker, Frans P. M. Beenker, Loek Thijssen
A realistic fault model and test algorithms for static random access memories. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 9 (6) (1990)
Frans P. M. Beenker, Barry J. Dekker, Richard Stans, Max van der Star
Implementing Macro Test in Silicon Compiler Design. IEEE Des. Test Comput. 7 (2) (1990)
Rob Dekker, Frans P. M. Beenker, Loek Thijssen
Realistic built-in self-test for static RAMs. IEEE Des. Test 6 (1) (1989)
Frans P. M. Beenker, Rob Dekker, Rudi Stans, Max van der Star
A Testability Strategy for Silicon Compilers. ITC (1989)
Frans P. M. Beenker, Rob Dekker, Loek Thijssen
Fault Modeling and Test Algorithm Development. ITC (1988)
Frans P. M. Beenker, Rob Dekker, Loek Thijssen
A Realistic Self-Test Machine for Static Random Access Memories. ITC (1988)
Michiel M. Ligthart, Emile H. L. Aarts, Frans P. M. Beenker
Design-for-testability of PLA's using statistical cooling. DAC (1986)
Frans P. M. Beenker, Karel J. E. van Eerdewijk, Robert B. W. Gerritsen, Frank N. Peacock, Max van der Star
Macro Testing: Unifying IC and Board Test. IEEE Des. Test 3 (6) (1986)
Frans P. M. Beenker
Systematic and Structured Methods for Digital Board Testing. ITC (1985)