Fault Modeling and Test Algorithm Development.
Frans P. M. BeenkerRob DekkerLoek ThijssenPublished in: ITC (1988)
Keyphrases
- computational cost
- dynamic programming
- detection algorithm
- high accuracy
- k means
- cost function
- segmentation algorithm
- learning algorithm
- theoretical analysis
- computationally efficient
- worst case
- experimental evaluation
- tree structure
- preprocessing
- computational complexity
- improved algorithm
- clustering method
- objective function
- convex hull
- neural network
- particle swarm optimization
- similarity measure
- case study
- feature selection
- optimization algorithm
- times faster
- single pass
- recognition algorithm
- significant improvement
- simulated annealing
- reinforcement learning
- data structure
- mobile robot
- search space