Loek Thijssen

Publication Activity (10 Years)

Years Active: 1988-1993
Publications (10 Years): 0

Publications

Hans Bouwmeester, Steven Oostdijk, Frank Bouwman, Rudi Stans, Loek Thijssen, Frans P. M. Beenker
Minimizing Test Time by Exploiting Parallelism in Macro Test. ITC (1993)
Rob Dekker, Frans P. M. Beenker, Loek Thijssen
A realistic fault model and test algorithms for static random access memories. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 9 (6) (1990)
R. Meershoek, Bas Verhelst, Rory McInerney, Loek Thijssen
testing on a static RAM. ITC (1990)
Rob Dekker, Frans P. M. Beenker, Loek Thijssen
Realistic built-in self-test for static RAMs. IEEE Des. Test 6 (1) (1989)
Frans P. M. Beenker, Rob Dekker, Loek Thijssen
Fault Modeling and Test Algorithm Development. ITC (1988)
Frans P. M. Beenker, Rob Dekker, Loek Thijssen
A Realistic Self-Test Machine for Static Random Access Memories. ITC (1988)