Login / Signup
Minimizing Test Time by Exploiting Parallelism in Macro Test.
Hans Bouwmeester
Steven Oostdijk
Frank Bouwman
Rudi Stans
Loek Thijssen
Frans P. M. Beenker
Published in:
ITC (1993)
Keyphrases
</>
test data
data sets
learning algorithm
training data
test cases