Fault-Pattern Oriented Defect Diagnosis for Flash Memory.
Mu-Hsien HsuYu-Tsao HsingJen-Chieh YehCheng-Wen WuPublished in: MTDT (2006)
Keyphrases
- flash memory
- fault diagnosis
- fault detection
- multiple faults
- garbage collection
- solid state
- file system
- buffer management
- main memory
- disk drives
- random access
- embedded systems
- neural network
- failure modes
- hand held devices
- b tree
- fault model
- model based diagnosis
- storage devices
- data storage
- fault management
- database systems
- normal operation
- fault models
- associative memory
- diagnostic tests
- object oriented
- high dimensional
- artificial intelligence
- data mining